Refractometric sensing in silica microcapillaries with nanocrystal-embedded films
Date:
Presentation at Alberta Quantum-Nano Workshop, Red Deer, Alberta
Citation: McFarlane, S.; Manchee, C.P.K.; Zamora, V.; Silverstone, J.; Veinot, J.G.C.; Meldrum, A., Refractometric sensing in silica microcapillaries with nanocrystal-embedded films, Alberta Quantum-Nano Workshop (Red Deer, Alberta, July 2011)